Electron Bombardment Ion Source for a Mass Spectrometer

MEMS ion source for mass spectrometer integrated on a chip

Electron Emission from Inconel under Ion Bombardment

Electron yields from clean and oxydized Inconel 625 surfaces have been measured for H', H:, Hef, 0' and Ar+ ions at normal incidence in the energy range 1.5-40 keV. These measurements have been made under ultrahigh vacuum and the samples were freed of surface contaminants by bombarding with high doses of either 20 keV H l or 30 keV Ar+ ions. Differences in yields of oxydized versus clean surfac...

Uv-laser Desorption Ion Source Applied to a Secondary Ion Mass Spectrometer

M. Hilchenbach, T. Lang, K. Hornung, L. Thirkell and C. Briois, Max-Planck-Institut für Sonnensystemforschung, Max-Planckstr. 2, 37191, Katlenburg-Lindau, Germany, Laserzentrum Hannover eV, Hollerithallee 8, 30419 Hannover, Germany, Institut für Strömungsmechanik und Aerodynamik, Fakultät für Luft-und Raumfahrttechnik, Universität der Bundeswehr München, Werner-Heisenberg-Weg 39, 85577 Neubiber...

Macromolecular ion accelerator mass spectrometer.

We present a newly developed macromolecular ion accelerator mass spectrometer that combines a dual-ion-trap device and a macromolecular ion accelerator (MIA) to achieve the capability of analyzing samples with a mixture of large biomolecules. MIA greatly increases detection efficiency. The dual ion trap includes a quadrupole ion trap (QIT) and a linear ion trap (LIT) in tandem. The dual ion tra...

Tuning of an electrospray ionization source for maximum peptide-ion transmission into a mass spectrometer.

We describe assembly and optimization of a continuous flow nanoelectrospray source for high-performance analysis on a routine basis. It is derived from an inJection adaptable Fine Ionization Source ("JaFIS"), previously shown to be durable and easy to use (Geromanos, S.; et al. Rapid Commun. Mass Spectrom. 1998, 12, 551-556) and now modified for maximum sensitivity. Proper design, manufacturing...